Surface Heterogeneity in Amorphous Silica Nanoparticles Evidenced from Tapping AFM-IR Nanospectroscopy.
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DOI: 10.1021/acs.analchem.2c04533
Abstract: In this work, we propose to evaluate and validate an emerging spectroscopic space-resolved technique: atomic force microscopy coupled with infrared spectroscopy (AFM-IR) for inorganic materials in tapping mode at the nanoscale. For this aim, a… read more here.
Keywords: afm; surface; surface heterogeneity; tapping afm ... See more keywords