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Published in 2021 at "Small"
DOI: 10.1002/smll.202102495
Abstract: Kelvin probe force microscopy (KPFM) is a popular technique for mapping the surface potential at the nanoscale through measurement of the Coulombic force between an atomic force microscopy (AFM) tip and sample. The lateral resolution…
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Keywords:
microscopy;
tapping mode;
force microscopy;
force ... See more keywords
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Published in 2019 at "Micron"
DOI: 10.1016/j.micron.2018.12.007
Abstract: Higher harmonics have been widely used to characterize nanomechanical properties of the sample surface in tapping mode atomic force microscopy. They are usually analyzed by the Fourier transform method which provides time-averaged amplitude and phase…
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Keywords:
higher harmonics;
mode atomic;
microscopy;
wavelet ... See more keywords
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Published in 2017 at "ACS nano"
DOI: 10.1021/acsnano.7b04530
Abstract: Tapping mode atomic force microscopy (AFM), also known as amplitude modulated (AM) or AC mode, is a proven, reliable, and gentle imaging mode with widespread applications. Over the several decades that tapping mode has been…
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Keywords:
mode;
range;
tapping mode;
bimodal tapping ... See more keywords
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Published in 2019 at "Journal of Applied Physics"
DOI: 10.1063/1.5053597
Abstract: We present electrostatic Micro-Electromechanical System actuators equipped with dimples and contact pads. The introduction of dimples and contact pads is shown to prevent stiction between the actuator and bottom electrodes and minimize dielectric charging and…
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Keywords:
mode oscillations;
range;
dimples contact;
tapping mode ... See more keywords
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Published in 2024 at "Chaos"
DOI: 10.1063/5.0194934
Abstract: In the phenomenon of mixed-mode oscillations, transitions between large-amplitude and small-amplitude oscillations may lead to anomalous jitter in the probe of a tapping mode atomic force microscope (TM-AFM) during the scanning process, thereby affecting the…
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Keywords:
mixed mode;
mode;
atomic force;
tapping mode ... See more keywords
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Published in 2020 at "Nanotechnology"
DOI: 10.1088/1361-6528/ab9390
Abstract: We present a method by which weak multi-harmonic signals acquired during a normal tapping mode (amplitude modulated) AFM scan of a sample in air or vacuum with standard microcantilevers can be used to map quantitatively…
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Keywords:
microscopy;
tapping mode;
air vacuum;
multi harmonic ... See more keywords
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Published in 2025 at "Optics letters"
DOI: 10.1364/ol.580667
Abstract: In the quest for precise microscale material characterization, the development of high-performance sensors has become a pivotal research area. This study reports what we believe to be the first development of a dynamic microforce sensor…
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Keywords:
fiber microcantilever;
tapping mode;
microcantilever probe;
sensitivity ... See more keywords
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Published in 2018 at "Nanomaterials"
DOI: 10.3390/nano8100807
Abstract: In this work PeakForce tapping (PFT) imaging was demonstrated with carbon nanotube atomic force microscopy (CNT-AFM) probes; this imaging mode shows great promise for providing simple, stable imaging with CNT-AFM probes, which can be difficult…
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Keywords:
mode;
microscopy;
tapping mode;
cnt afm ... See more keywords