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Published in 2025 at "Surface and Interface Analysis"
DOI: 10.1002/sia.70013
Abstract: A 2H‐TaS2 (0001) single crystal was studied with XPS. The quantification and fitting procedures for this material are discussed in detail. It is shown that conventional approaches for data deconvolution fail, and an in‐depth analysis…
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Keywords:
analysis;
tas2 0001;
analysis tas2;
considerations xps ... See more keywords