Interface characteristics and recrystallization mechanism of dissimilar titanium bonds
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DOI: 10.1007/s10853-017-1950-4
Abstract: Characteristics of Ti–6Al–4V (TC4)/Ti–5Al–2Sn–2Zr–4Mo–4Cr (TC17) bonding interface were investigated via electron backscatter diffraction, transmission electron microscopy and high-resolution transmission electron microscopy techniques. Special attention was paid to clarify the recrystallization mechanism at the bonding interface.… read more here.
Keywords: phase; tc4 tc17; microscopy; tc17 ... See more keywords