Time-dependent dielectric breakdown (TDDB) reliability analysis of CMOS analog and radio frequency (RF) circuits
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DOI: 10.1007/s10470-018-1243-0
Abstract: In this paper, a methodology to analyze the time dependent dielectric breakdown (TDDB) reliability of CMOS analog and radio frequency (RF) circuits has been proposed and applied to common circuit building blocks, including an operational… read more here.
Keywords: analysis; topology; tddb; time dependent ... See more keywords