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Published in 2020 at "Applied Sciences"
DOI: 10.3390/app10238478
Abstract: Donggeun You 1, Hyunwoo Heo 1, Hyungseup Kim 1 , Yongsu Kwon 1, Sangmin Lee 2 and Hyoungho Ko 1,* 1 Department of Electronics Engineering, Chungnam National University, Daejeon 34134, Korea;
[email protected] (D.Y.);
[email protected] (H.H.);…
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Keywords:
line interference;
cnu;
technique current;
power line ... See more keywords