TEM bright field imaging of thick specimens: nodes in Thon ring patterns.
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DOI: 10.1016/j.ultramic.2020.113023
Abstract: The thickness of an object will, at some point, exceed the depth of field of a transmission electron microscope; the value at which this occurs, depends on the resolution and the wavelength considered. An image… read more here.
Keywords: thon ring; field; imaging thick; tem bright ... See more keywords