In-situ Device-level TEM Characterization Based on Ultra-flexible Multilayer MoS2 Micro-cantilever.
Sign Up to like & getrecommendations! Published in 2023 at "Advanced materials"
DOI: 10.1002/adma.202301439
Abstract: Current state-of-the-art in-situ TEM characterization technology has been capable of statically or dynamically nanorobotic manipulating specimens, affording abundant atom-level material attributes. However, an insurmountable barrier between material attributes investigations and device-level application explorations exists due… read more here.
Keywords: tem; situ device; characterization; device level ... See more keywords
Facile sample preparation method allowing TEM characterization of the stacking structures and interlayer spaces of clay minerals
Sign Up to like & getrecommendations! Published in 2019 at "Applied Clay Science"
DOI: 10.1016/j.clay.2019.01.019
Abstract: Abstract Transmission electron microscopy (TEM) is an essential and irreplaceable technique for studying the micromorphology and microstructure of clay minerals. However, observing layer stacking and detecting the interlayer spaces of clay minerals by TEM are… read more here.
Keywords: interlayer spaces; method; clay minerals; tem characterization ... See more keywords
Cross section TEM characterization of high-energy-Xe-irradiated U-Mo
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Nuclear Materials"
DOI: 10.1016/j.jnucmat.2017.03.011
Abstract: Abstract U-Mo alloys irradiated with 84 MeV Xe ions to various doses were characterized with transmission electron microscopy (TEM) and scanning transmission electron microscopy (STEM) techniques. The TEM thin foils were prepared perpendicular to the irradiated… read more here.
Keywords: section tem; microscopy; tem characterization; characterization high ... See more keywords
In-situ TEM Characterization of Ultra-robust Memristors Based on Fully Layered Two-dimensional Materials
Sign Up to like & getrecommendations! Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618009911
Abstract: 1. National Laboratory of Solid State Microstructures, College of Engineering and Applied Sciences and Collaborative Innovation Center of Advanced Microstructures, Nanjing University, Nanjing, China. 2. School of Physics, Collaborative Innovation Center of Advanced Microstructures, Nanjing… read more here.
Keywords: characterization ultra; tem characterization; situ tem; physics ... See more keywords
TEM Characterization of Ball Milled Synthesized CIGS, CIS and CGS Nanoparticles for Energy Applications
Sign Up to like & getrecommendations! Published in 2018 at "Microscopy and Microanalysis"
DOI: 10.1017/s1431927618010528
Abstract: Solar light can be captured by semiconducting particles and transformed into a fuel by inducing CO2 reduction and water decomposition. Thus appropriate semiconducting particles need to be identified and synthesized with appropriate and inexpensive processing.… read more here.
Keywords: ball milled; energy; tem characterization; microscopy ... See more keywords