A 0.66erms− Temporal-Readout-Noise 3-D-Stacked CMOS Image Sensor With Conditional Correlated Multiple Sampling Technique
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DOI: 10.1109/jssc.2017.2765927
Abstract: This paper presents a sub-electron temporal readout noise, 8.3 Mpixel and 1.1- $\mu \text{m}$ pixel pitch 3-D-stacked CMOS image sensor (CIS). A conditional correlated multiple sampling (CMS) technique is introduced to selectively reduce the dark… read more here.
Keywords: technique; readout noise; stacked cmos; noise ... See more keywords