Characterization of PillarHall test chip structures using reflectometry technique
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DOI: 10.1088/1361-6501/acda54
Abstract: Thin film samples where one of the thin layers consists of vacuum or air are called PillarHalls due to their support structure in silicon wafers. Custom PillarHall samples were provided by manufacturer and characterized by… read more here.
Keywords: test chip; characterization pillarhall; pillarhall test; reflectometry ... See more keywords
Characterization of radiation effects in 65 nm digital circuits with the DRAD digital radiation test chip
Sign Up to like & getrecommendations! Published in 2017 at "Journal of Instrumentation"
DOI: 10.1088/1748-0221/12/02/c02039
Abstract: A Digital RADiation (DRAD) test chip has been specifically designed to study the impact of Total Ionizing Dose (TID) ( read more here.
Keywords: test chip; digital radiation; characterization radiation; test ... See more keywords