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   Articles with "test compaction" as a keyword



Functional Compaction for Functional Test Sequences

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recommendations! Published in 2024 at "IEEE Access"

DOI: 10.1109/access.2024.3429248

Abstract: The occurrence of silent data corruption because of hardware defects in large scale data centers points to the advantages of applying functional test sequences to detect hardware defects that escape scan-based tests. When using functional… read more here.

Keywords: test compaction; test; sequence; test sequences ... See more keywords

Dynamic Test Compaction of a Compressed Test Set Shared Among Logic Blocks

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recommendations! Published in 2024 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2023.3307352

Abstract: Distributed test data compression refers to the scenario where each logic block in a design has its own decompression logic and compact set of compressed tests. A static test compaction procedure for this scenario was… read more here.

Keywords: compressed test; test compaction; logic; test ... See more keywords

Modular Functional Test Sequences for Test Compaction

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recommendations! Published in 2025 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2025.3573223

Abstract: Ensuring correct functional operation of a chip requires extensive testing. Without the constraints of maintaining functional operation conditions, structural (scan-based) tests allow high-fault coverage to be achieved efficiently. To cover defects that are only exhibited… read more here.

Keywords: test compaction; logic; test; test sequences ... See more keywords

Extended Transparent-Scan

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recommendations! Published in 2019 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2019.2916497

Abstract: Transparent-scan is an approach to test compaction where scan shift cycles and functional capture cycles are interleaved in arbitrary ways as needed for detecting target faults. This is achieved by viewing the scan enable input… read more here.

Keywords: extended transparent; input; test compaction; transparent scan ... See more keywords

Test Compaction by Backward and Forward Extension of Multicycle Tests

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recommendations! Published in 2021 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2020.3028005

Abstract: Multicycle tests are useful for test compaction even when full scan allows single- or two-cycle tests to be used. To avoid sequential test generation, multicycle tests can use the test data (scan-in states and primary… read more here.

Keywords: multicycle; multicycle tests; test compaction; extension ... See more keywords

Preponing Fault Detections for Test Compaction Under Transparent Scan

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recommendations! Published in 2022 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2022.3189804

Abstract: A test compaction procedure under transparent scan can compact a scan-based test set that contains a minimum number of tests. The additional test compaction can be important in applications that require highly compacted test sets.… read more here.

Keywords: test compaction; compaction; fault detections; transparent scan ... See more keywords