Extended Transparent-Scan
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DOI: 10.1109/tvlsi.2019.2916497
Abstract: Transparent-scan is an approach to test compaction where scan shift cycles and functional capture cycles are interleaved in arbitrary ways as needed for detecting target faults. This is achieved by viewing the scan enable input… read more here.
Keywords: extended transparent; input; test compaction; transparent scan ... See more keywords
Test Compaction by Backward and Forward Extension of Multicycle Tests
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DOI: 10.1109/tvlsi.2020.3028005
Abstract: Multicycle tests are useful for test compaction even when full scan allows single- or two-cycle tests to be used. To avoid sequential test generation, multicycle tests can use the test data (scan-in states and primary… read more here.
Keywords: multicycle; multicycle tests; test compaction; extension ... See more keywords
Preponing Fault Detections for Test Compaction Under Transparent Scan
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2022.3189804
Abstract: A test compaction procedure under transparent scan can compact a scan-based test set that contains a minimum number of tests. The additional test compaction can be important in applications that require highly compacted test sets.… read more here.
Keywords: test compaction; compaction; fault detections; transparent scan ... See more keywords