Enhancing Test Compression With Dependency Analysis for Multiple Expansion Ratios
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DOI: 10.1109/tcad.2017.2681063
Abstract: Scan test data compression is widely used in industry to reduce test data volume (TDV) and test application time (TAT). This paper shows how multiple scan chain expansion ratios can help to obtain high test… read more here.
Keywords: compression; test compression; expansion ratios; multiple expansion ... See more keywords