Reduced-Pin-Count BOST for Test-Cost Reduction
Sign Up to like & getrecommendations! Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2021.3065912
Abstract: Built-off self-test (BOST) is a widely used technique to reduce the test cost. It makes it possible to test high-speed dynamic random-access memory (DRAM) without using a costly high-performance automatic test equipment (ATE). However, the… read more here.
Keywords: reduced pin; cost reduction; cost; test cost ... See more keywords