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Published in 2020 at "Journal of Software: Evolution and Process"
DOI: 10.1002/smr.2215
Abstract: Mobile devices have limited resources, including memory and processing speed. The performance of mobile applications is an important concern. There are a large number of mobile platforms available with varying operating systems and hardware. Native…
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Keywords:
performance test;
test generation;
performance;
approach ... See more keywords
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Published in 2020 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2019.2948904
Abstract: Flow-based microfluidic biochips have become a promising platform for complex biochemical assays. As the integration of such chips is increasing, a flexible general reconfigurable platform, fully programmable valve array (FPVA), has emerged. Such a 2-D…
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Keywords:
microfluidic biochips;
flow based;
test;
test generation ... See more keywords
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Published in 2019 at "IEEE Transactions on Device and Materials Reliability"
DOI: 10.1109/tdmr.2019.2911022
Abstract: Software-based self-test (SBST) is being widely used in both manufacturing and in-the-field testing of processor-based devices and systems-on-chips. Unfortunately, the stuck-at fault model is increasingly inadequate to match the new and different types of defects…
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Keywords:
test;
based self;
test generation;
software based ... See more keywords
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Published in 2021 at "IEEE Transactions on Software Engineering"
DOI: 10.1109/tse.2019.2953066
Abstract: The massive progress of machine learning has seen its application over a variety of domains in the past decade. But how do we develop a systematic, scalable and modular strategy to validate machine-learning systems? We…
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Keywords:
machine;
machine learning;
grammar based;
learning systems ... See more keywords
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Published in 2023 at "IEEE Transactions on Software Engineering"
DOI: 10.1109/tse.2022.3227418
Abstract: Automated test case generation has proven to be useful to reduce the usually high expenses of software testing. However, several studies have also noted the skepticism of testers regarding the comprehension of generated test suites…
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Keywords:
evolutionary test;
test generation;
test;
generation ... See more keywords
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Published in 2020 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2019.2947183
Abstract: Taking advantage of multicore architectures can provide significant improvement for many design automation problems. However, the parallelization procedure introduces challenges, such as workload duplication, limited search space exploration, and race contention among different threads. In…
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Keywords:
generation;
test;
shared memory;
generation using ... See more keywords
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Published in 2023 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2022.3224361
Abstract: Path selection procedures identify path delay faults whose tests detect small delay defects. Path selection criteria are positive in the sense that they point to paths that should be selected, e.g., the longest paths. However,…
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Keywords:
procedure;
test generation;
delay faults;
path ... See more keywords