A Test Pattern Generation Technique for Approximate Circuits Based on an ILP-Formulated Pattern Selection Procedure
Sign Up to like & getrecommendations! Published in 2019 at "IEEE Transactions on Nanotechnology"
DOI: 10.1109/tnano.2019.2923040
Abstract: Intrinsic resiliency of many today's applications opens new design opportunities. Some computation accuracy loss within the so-called resilient kernels does not affect the global quality of results. This has led the scientific community to introduce… read more here.
Keywords: approximation; test; test pattern; pattern generation ... See more keywords
A New Static Compaction of Deterministic Test Sets
Sign Up to like & getrecommendations! Published in 2023 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2023.3240246
Abstract: Test set compaction is one of the key steps of the postproduction test known to bring down test pattern counts. This, in turn, allows one to reduce the corresponding test data volume, test application time,… read more here.
Keywords: compaction; deterministic test; test pattern; test set ... See more keywords
An approach to Measure Transition Density of Binary Sequences for X-filling based Test Pattern Generator in Scan based Design
Sign Up to like & getrecommendations! Published in 2018 at "International Journal of Electrical and Computer Engineering"
DOI: 10.11591/ijece.v8i4.pp2063-2071
Abstract: Switching activity and Transition density computation is an essential stage for dynamic power estimation and testing time reduction. The study of switching activity, transition densities and weighted switching activities of pseudo random binary sequences generated… read more here.
Keywords: transition density; test pattern; transition; pattern generator ... See more keywords
Varying test-pattern duration to explore the dynamics of contrast-comparison and contrast-normalization processes
Sign Up to like & getrecommendations! Published in 2023 at "Journal of Vision"
DOI: 10.1167/jov.23.1.15
Abstract: In this paper, we examine the dynamics of contrast-comparison and contrast-normalization processes. Observers adapted (for 1 second) to a grid of Gabor patches at one contrast; then a test pattern (which varied in duration from… read more here.
Keywords: test pattern; contrast comparison; duration; test ... See more keywords