Arranging a Pool of Functional Test Sequences for Variable In-Field Test Periods
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DOI: 10.1109/access.2025.3528741
Abstract: High workloads applied to a system cause chips to be more susceptible to aging effects that may eventually result in hardware defects. The detection of the defects requires tests for delay faults to be applied… read more here.
Keywords: field; test periods; field test; test ... See more keywords