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Published in 2018 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"
DOI: 10.1109/tvlsi.2018.2849972
Abstract: A simulation-based design verification process creates a large pool of functional test sequences. Such sequences have several advantages when they are used as manufacturing tests and for defect diagnosis. This brief considers the problem of…
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Keywords:
defect diagnosis;
functional test;
diagnosis;
selecting functional ... See more keywords