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Functional Compaction for Functional Test Sequences

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0 Published in 2024 at "IEEE Access"

DOI: 10.1109/access.2024.3429248

Abstract: The occurrence of silent data corruption because of hardware defects in large scale data centers points to the advantages of applying functional test sequences to detect hardware defects that escape scan-based tests. When using functional… read more here.

Keywords: test compaction; test; sequence; test sequences ... See more keywords

Arranging a Pool of Functional Test Sequences for Variable In-Field Test Periods

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0 Published in 2025 at "IEEE Access"

DOI: 10.1109/access.2025.3528741

Abstract: High workloads applied to a system cause chips to be more susceptible to aging effects that may eventually result in hardware defects. The detection of the defects requires tests for delay faults to be applied… read more here.

Keywords: field; test periods; field test; test ... See more keywords

Functional Design-for-Testability for Functional Test Sequences

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0 Published in 2024 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2024.3396654

Abstract: Two properties of functional test sequences make them suitable for complementing scan-based tests: they can detect defects whose activation requires large numbers of functional capture cycles while avoiding nonfunctional operation conditions. However, the gate-level fault… read more here.

Keywords: logic; test; test sequences; functional test ... See more keywords

Modular Functional Test Sequences for Test Compaction

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0 Published in 2025 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"

DOI: 10.1109/tcad.2025.3573223

Abstract: Ensuring correct functional operation of a chip requires extensive testing. Without the constraints of maintaining functional operation conditions, structural (scan-based) tests allow high-fault coverage to be achieved efficiently. To cover defects that are only exhibited… read more here.

Keywords: test compaction; logic; test; test sequences ... See more keywords

Selecting Functional Test Sequences for Defect Diagnosis

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0 Published in 2018 at "IEEE Transactions on Very Large Scale Integration (VLSI) Systems"

DOI: 10.1109/tvlsi.2018.2849972

Abstract: A simulation-based design verification process creates a large pool of functional test sequences. Such sequences have several advantages when they are used as manufacturing tests and for defect diagnosis. This brief considers the problem of… read more here.

Keywords: defect diagnosis; functional test; diagnosis; selecting functional ... See more keywords