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Published in 2021 at "International Journal of Electrical and Computer Engineering"
DOI: 10.11591/ijece.v11i3.pp2704-2710
Abstract: Designing VLSI digital circuits is challenging tasks because of testing the circuits concerning design time. The reliability and productivity of digital integrated circuits are primarily affected by the defects in the manufacturing process or systems.…
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Keywords:
fault;
fault tolerant;
asynchronous circuits;
fault injection ... See more keywords