High Spatial Resolution Thermal Mapping of Volatile Switching in NbOx-Based Memristor Using In Situ Scanning Thermal Microscopy.
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DOI: 10.1021/acsami.2c06870
Abstract: Temperature mapping by in situ thermoreflectance thermal imaging (TRTI) or midwave infrared spectroscopy has played an important role in understanding the origins of threshold switching and the effect of insulator-metal transitions in oxide-based memrsitive devices.… read more here.
Keywords: spatial resolution; microscopy; thermal mapping; thermal microscopy ... See more keywords