Impact of Various Thermistors on the Properties of Resistive Microbolometers Fabricated by CMOS Process
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DOI: 10.3390/mi13111869
Abstract: Microbolometers based on the CMOS process has the important advantage of being automatically merged with circuits in the fabrication of larger arrays, but they typically suffer from low detectivity due to the difficulty in realizing… read more here.
Keywords: cmos process; impact various; resistive microbolometers; various thermistors ... See more keywords