Thermoelectric Scanning-Gate Interferometry on a Quantum Point Contact
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DOI: 10.1103/physrevapplied.11.034069
Abstract: We introduce a new scanning probe technique derived from scanning gate microscopy (SGM) in order to investigate thermoelectric transport in two-dimensional semiconductor devices. The thermoelectric scanning gate Microscopy (TSGM) consists in measuring the thermoelectric voltage… read more here.
Keywords: microscopy; thermoelectric scanning; interferometry; point contact ... See more keywords