Mueller matrix modeling of thick anisotropic crystals with metallic coatings
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DOI: 10.1016/j.apsusc.2016.10.124
Abstract: Abstract The optical behavior of thin multilayer systems can be analyzed by generalized ellipsometry and modeled using transfer matrices. Recently, a method has been implemented for modeling the interference of multiply-reflected partial waves in the… read more here.
Keywords: thick anisotropic; mueller matrix; mueller; matrix modeling ... See more keywords