Effect of thickness on metal-to-semiconductor transition in 2-dimensional TiN thin films
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DOI: 10.1063/5.0046243
Abstract: Titanium nitride thin films have been grown on c-plane sapphire substrates using a pulsed laser deposition technique in the thickness range of 6–45 nm. X-ray diffraction (XRD) analysis has demonstrated TiN (111) as the preferred orientation… read more here.
Keywords: thin films; tin; tin thin; thickness metal ... See more keywords
Determination of Proper Ultrasonic Frequency Based on Wall Thickness of the Metal Pipes in Ultrasonic Tomography Systems
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DOI: 10.1080/03772063.2018.1557085
Abstract: In this research, determination of the applicable ultrasonic sensors based on the wall thickness of the metal pipe for the purpose of transmission tomography is studied. The range of applicable ultrasonic frequencies according to the… read more here.
Keywords: thickness metal; wall thickness; thickness; tomography ... See more keywords