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Published in 2025 at "Advanced Electronic Materials"
DOI: 10.1002/aelm.202500451
Abstract: The total thickness scaling of electrodes and the (Al0.9Sc0.1)N layer is evaluated for ferroelectric memory applications. The good crystal orientation and large remanent polarization (Pr) above 100 µC cm−2 are obtained for 160‐nm‐thick (Al0.9Sc0.1)N films…
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Keywords:
thickness scaling;
bottom electrode;
scaling integrated;
electrode ... See more keywords
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Published in 2022 at "ACS applied materials & interfaces"
DOI: 10.1021/acsami.2c15369
Abstract: The comparatively high coercive field in Hf0.5Zr0.5O2 (HZO) and other HfO2-based ferroelectric thin films leads to two critical challenges for their application in embedded ferroelectric memory: high operating voltage due to a large thickness-field product…
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Keywords:
thickness scaling;
operating voltage;
voltage;
memory ... See more keywords