Articles with "thin amorphous" as a keyword



Spectroscopic Signatures of Ultra‐Thin Amorphous Carbon with the Tuned Disorder Directly Grown on a Dielectric Substrate

Sign Up to like & get
recommendations!
Published in 2024 at "Advanced Materials"

DOI: 10.1002/adma.202413732

Abstract: The reduced structural complexity of atomically thin amorphous carbons makes it suitable for semiconductor technology. Inherent challenges arise from transfer processes subsequent to growth on metallic substrates, posing significant challenges to the accurate characterization of… read more here.

Keywords: spectroscopy; spectroscopic; carbon; ultra thin ... See more keywords
Photo by ldxcreative from unsplash

Free-Standing Molecularly Thin Amorphous Silica Nanosheets.

Sign Up to like & get
recommendations!
Published in 2023 at "Small"

DOI: 10.1002/smll.202300022

Abstract: Recent progress in 2D materials has initiated new fields of molecularly thin amorphous materials with mysterious properties and structures. However, designed synthesis of molecularly thin amorphous silica still remains a challenge; whether free-standing molecularly thin… read more here.

Keywords: free standing; thin amorphous; molecularly thin; silica nanosheets ... See more keywords

Observing growth and interfacial dynamics of nanocrystalline ice in thin amorphous ice films

Sign Up to like & get
recommendations!
Published in 2024 at "Nature Communications"

DOI: 10.1038/s41467-024-45234-x

Abstract: In-situ cryo-electron microscopy in thin amorphous ice films and ice-dynamics simulations reveal polymorph-dependent growth kinetics of nanoscale ice crystals. Hetero-crystalline ice exhibits anisotropic growth: fast-growing facets are associated with low-density interfaces, driving tetrahedral ordering of… read more here.

Keywords: ice films; ice; thin amorphous; amorphous ice ... See more keywords
Photo from archive.org

Structural and Dielectric Study of Thin Amorphous Layers of the Ge–Sb–Te System Prepared by RF Magnetron Sputtering

Sign Up to like & get
recommendations!
Published in 2020 at "Semiconductors"

DOI: 10.1134/s106378262002013x

Abstract: Abstract The results of studying the structure and processes of dielectric relaxation in thin layers of Ge–Sb–Te are presented. The found permittivity dispersion and occurrence of dielectric-loss maxima in the low-frequency region are explained by… read more here.

Keywords: structural dielectric; thin amorphous; amorphous layers; dielectric study ... See more keywords