Impact of Substrate Thickness on the Degradation in Multicrystalline Silicon
Sign Up to like & getrecommendations! Published in 2021 at "IEEE Journal of Photovoltaics"
DOI: 10.1109/jphotov.2020.3038412
Abstract: Light and elevated-temperature-induced degradation (LeTID) is a well-known phenomenon that reduces the bulk lifetime in silicon wafers. The cause of this degradation mechanism is still under investigation. However, a wide range of empirical trends that… read more here.
Keywords: impact substrate; substrate thickness; silicon; degradation ... See more keywords