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Published in 2017 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2017.01.001
Abstract: Abstract Effect of rapid thermal annealing (RTA) on crystal defects in a GaN layer grown on a (111)Si substrate was investigated by photoluminescence (PL) and transmission electron microscopy (TEM) analyses. The PL spectra suggested that… read more here.
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Published in 2020 at "Journal of Crystal Growth"
DOI: 10.1016/j.jcrysgro.2020.125575
Abstract: Abstract We report reducing the density of threading dislocations (TDs) in stacking-fault-free semipolar (20 2 ¯ 1 ) GaN grown on sapphire by inserting an AlGaN/GaN superlattice (SL). We have studied the influence of AlGaN/GaN… read more here.
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Published in 2022 at "Nano letters"
DOI: 10.1021/acs.nanolett.2c01479
Abstract: The compositional and structural investigations of threading dislocations (TDs) in InGaN/GaN multiple quantum wells were carried out using correlative transmission electron microscopy (TEM) and atom probe tomography (APT). The correlative TEM/APT analysis on the same… read more here.
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Published in 2020 at "Scientific Reports"
DOI: 10.1038/s41598-020-74030-y
Abstract: III-nitride compound semiconductors are breakthrough materials regarding device applications. However, their heterostructures suffer from very high threading dislocation (TD) densities that impair several aspects of their performance. The physical mechanisms leading to TD nucleation in… read more here.
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Published in 2025 at "Scientific Reports"
DOI: 10.1038/s41598-024-83398-0
Abstract: GaN is rapidly gaining attention for implementation in power electronics but is still impacted by its high density of threading dislocations (TDs), which have been shown to facilitate current leakage through devices limiting their performance… read more here.
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Published in 2018 at "Journal of Applied Physics"
DOI: 10.1063/1.5009521
Abstract: X-ray diffraction is one of the most popular experimental methods employed for determination of dislocation densities, as it can recognize both the strain fields and the local lattice rotations produced by dislocations. The main challenge… read more here.
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Published in 2018 at "Journal of Applied Physics"
DOI: 10.1063/1.5010859
Abstract: The influence of open-core threading dislocations on the bias-dependent external quantum efficiency (EQE) of bottom-illuminated Al0.5Ga0.5N/AlN metal-semiconductor-metal (MSM) photodetectors (PDs) is presented. These defects originate at the Al0.5Ga0.5N/AlN interface and terminate on the Al0.5Ga0.5N surface… read more here.
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Published in 2021 at "Journal of Applied Physics"
DOI: 10.1063/5.0053766
Abstract: The propagation behavior of threading dislocations (TDs) and the effects of Burgers vectors in hydride vapor phase epitaxy (HVPE) GaN bulk crystals generated on Na-flux-grown GaN and in a commercially available HVPE-grown GaN bulk crystal… read more here.
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Published in 2024 at "Applied Physics Letters"
DOI: 10.1063/5.0186842
Abstract: We present site-coincident imaging of a high dislocation density boron-doped chemical vapor deposition-grown homoepitaxial (001) diamond film using electron channeling contrast imaging (ECCI), cathodoluminescence, transmission electron microscopy (TEM), and scanning secondary ion mass spectroscopy (SIMS).… read more here.
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Published in 2022 at "Materials"
DOI: 10.3390/ma15072417
Abstract: In spite of great application potential as transparent n-type oxides with high electrical mobility at room temperature, threading dislocations (TDs) often found in the (Ba,La)SnO3 (BLSO) films can limit their intrinsic properties so that their… read more here.
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Published in 2021 at "Applied Physics Express"
DOI: 10.35848/1882-0786/ac2d10
Abstract: In order to realize lattice-mismatched solar cells with high conversion efficiencies, it is necessary to characterize the threading dislocations generated at the interfaces between materials with different lattice constants. We report on the characterization of… read more here.