Direct evaluation method to measure permittivity and conductivity of thin layers via wave approach in the THz region
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DOI: 10.1063/1.5115092
Abstract: The direct evaluation method for measuring the permittivity and conductivity of thin layers was proposed via the wave approach in the terahertz (THz) region. The terahertz time-domain spectroscopy (THz-TDS) was employed for performing experiments with… read more here.
Keywords: wave approach; thz region; method; permittivity conductivity ... See more keywords