Surface characterizations of TiH2 powders before and after dehydrogenation
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DOI: 10.1016/j.apsusc.2017.03.077
Abstract: Abstract The oxide film of TiH2 and HDH-Ti powder are investigated using X-ray photoelectron spectroscopy (XPS). The XPS depth profiles indicate that there exists mainly Ti2+, Ti3+, Ti4+ and Ti0 on TiH2 and HDH-Ti surface.… read more here.
Keywords: hdh; surface; sputtering depth; tih2 hdh ... See more keywords