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Published in 2022 at "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems"
DOI: 10.1109/tcad.2021.3135785
Abstract: In order to reduce defect parts per million, cell-aware (CA) methodology was proposed to cover various types of intracell defects. In this article, we present a novel methodology for generating 2-time-frame (2tf) CA tests based…
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Keywords:
cell;
methodology;
fault;
timing slack ... See more keywords