Characterization of TiN back contact interlayers with varied thickness for Cu2ZnSn(S,Se)4 thin film solar cells
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DOI: 10.1016/j.tsf.2017.08.030
Abstract: Abstract TiN thin films have previously been used as intermediate barrier layers on Mo back contacts in CZTS(e) solar cells to suppress excessive reaction of the Mo in the annealing step. In this work, TiN… read more here.
Keywords: microscopy; tin layers; tin; spectroscopy ... See more keywords