Light-induced bias stability of crystalline indium-tin-zinc-oxide thin film transistors
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DOI: 10.1016/j.apsusc.2020.146655
Abstract: Abstract Crystalline Indium–Tin–Zinc-Oxide (c-ITZO) thin films transistors (TFTs) are investigated to confirm the device performance and analyze the device reliability of c-ITZO under positive/negative bias stress with/without illumination. The deposited ITZO thin film is controlled… read more here.
Keywords: indium tin; tin zinc; thin film; zinc oxide ... See more keywords