High-precision atomic force microscopy with atomically-characterized tips
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DOI: 10.1088/1367-2630/ab8efd
Abstract: Traditionally, atomic force microscopy (AFM) experiments are conducted at tip–sample distances where the tip strongly interacts with the surface. This increases the signal-to-noise ratio, but poses the problem of relaxations in both tip and sample… read more here.
Keywords: atomically characterized; microscopy; force microscopy; tip sample ... See more keywords
A Novel Harmonic Atomic Force Microscopy With Tip-Sample Couplings
Sign Up to like & getrecommendations! Published in 2024 at "IEEE/ASME Transactions on Mechatronics"
DOI: 10.1109/tmech.2023.3317498
Abstract: This article presents a novel harmonic atomic force microscopy with tip-sample couplings (TS-HAFM) working in force modulation mode for imaging samples of different mechanical properties. Compared with traditional harmonic atomic force microscopy (T-HAFM), TS-HAFM has… read more here.
Keywords: harmonic atomic; force; sample couplings; tip sample ... See more keywords