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Published in 2017 at "Nanotechnology"
DOI: 10.1088/0957-4484/28/2/025702
Abstract: Amplitude modulated atomic force microscopy (AM-AFM) was used to examine the influence of the size of the AFM tip apex on the measured surface topography of single highly oriented pyrolytic graphite (HOPG) atomic steps. Experimental…
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Keywords:
topography;
hopg;
tip;
tip size ... See more keywords