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Published in 2019 at "IEEE Transactions on Device and Materials Reliability"
DOI: 10.1109/tdmr.2019.2912811
Abstract: This paper proposes a general method for the design of multiple node upset (MNU)-tolerant latches. First, two double node upset (DNU)-tolerant latches and one triple node upset (TNU)-tolerant latch are introduced. These proposed latches are…
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Keywords:
tolerant latch;
node upset;
multiple node;
design multiple ... See more keywords
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Published in 2020 at "IEEE Transactions on Emerging Topics in Computing"
DOI: 10.1109/tetc.2017.2776285
Abstract: As the process feature size continues to scale down, the susceptibility of logic circuits to radiation induced error has increased. This trend has led to the increase in sensitivity of circuits to multi-node upsets. Previously,…
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Keywords:
dnu tolerant;
tolerant latch;
triple node;
node upsets ... See more keywords
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Published in 2022 at "IEEE Transactions on Emerging Topics in Computing"
DOI: 10.1109/tetc.2020.3025584
Abstract: With the rapid advancement of CMOS technologies, nano-scale CMOS latches have become increasingly sensitive to multiple-node upset (MNU) errors caused by radiations. First, this paper proposes a novel latch design, namely QNUTL that can completely…
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Keywords:
tolerant latch;
quadruple node;
node upsets;
node upset ... See more keywords