Fast Bayesian Tomography of a Two-Qubit Gate Set in Silicon
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DOI: 10.1103/physrevapplied.17.024068
Abstract: T. J. Evans, W. Huang, J. Yoneda, R. Harper, T. Tanttu, K. W. Chan, F. E. Hudson, K. M. Itoh, A. Saraiva, C. H. Yang, A. S. Dzurak, and S. D. Bartlett Centre for Engineered… read more here.
Keywords: bayesian tomography; tomography two; two qubit; fast bayesian ... See more keywords