Total ionization dose and single event effects of a commercial stand-alone 4 Mb resistive random access memory (ReRAM)
Sign Up to like & getrecommendations! Published in 2019 at "Microelectronics Reliability"
DOI: 10.1016/j.microrel.2019.113443
Abstract: Abstract Experiments on total ionizing dose (TID) by cobalt-60 and single event effects (SEE) by pulsed laser and heavy ions were conducted on a 4 Mb commercial ReRAM from Fujitsu. The bit cell features two-transistor-two-resistor (2T2R)… read more here.
Keywords: total ionization; ionization dose; reram; event effects ... See more keywords
Corrigendum to “Absolute partial and total ionization cross sections of carbon monoxide with electron collision from 350 eV to 8000 eV”
Sign Up to like & getrecommendations! Published in 2024 at "Chinese Physics B"
DOI: 10.1088/1674-1056/ad3efc
Abstract: The numbers of longitudinal axis in Fig. of the paper [Chin. Phys. B 33 043401 (2024)] have been corrected. This modification does not affect the result presented in the paper. read more here.
Keywords: absolute partial; total ionization; cross sections; corrigendum absolute ... See more keywords