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Published in 2023 at "IEEE Transactions on Industrial Informatics"
DOI: 10.1109/tii.2022.3182343
Abstract: Deep learning (DL) has certainly improved industrial inspection, while significant progress has also been achieved in metrology with impressive results reached through their combination. However, it is not easy to deploy metrology sensors in a…
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Keywords:
regression framework;
deep regression;
methodology;
toward laboratory ... See more keywords