Towards artifact-free AFM image presentation and interpretation.
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DOI: 10.1111/jmi.13193
Abstract: Atomic force microscopy (AFM) is based upon a simple operational principle. However, the presentation and interpretation of AFM images can easily suffer from consequential artifacts that are easily overlooked. Here we discuss results from AFM… read more here.
Keywords: afm; towards artifact; microscopy; artifact free ... See more keywords