Bit-Flip Detection-Driven Selection of Trace Signals
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DOI: 10.1109/tcad.2017.2729458
Abstract: Since integrating memory blocks on-chip became affordable, embedded logic analysis has been used extensively for post-silicon validation and debugging. Deciding at design time which signals to be traceable at the post-silicon phase, has been posed… read more here.
Keywords: detection; trace; selection; bit flips ... See more keywords