Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy
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DOI: 10.1007/s11249-020-01349-y
Abstract: Efforts to reliably measure AFM lateral forces have been impeded by the difficulties in obtaining appropriate calibration standards, applying those force standards to the apex of the tip, and quantifying calibration uncertainty. Here we propose… read more here.
Keywords: lateral force; microscopy; traceable lateral; trl ... See more keywords