Tracing microscopic atomic displacements using polarized Raman spectroscopy: a case study on BaTiO3
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DOI: 10.1088/1361-6463/ac2c39
Abstract: Here, we demonstrate the power of polarized Raman spectroscopy (PRS) in tracing microscopic atomic displacements in a single crystalline material. Crystalline materials often show extremely small microscopic atomic displacements as a function of temperature, pressure,… read more here.
Keywords: atomic displacements; tracing microscopic; microscopic atomic; spectroscopy ... See more keywords