Volume Imaging By Tracking Sparse Topological Features In Electron Micrograph Tilt Series
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DOI: 10.1017/s1431927622001805
Abstract: The sensitive coherent interference of electron waves arising from a specimen is useful for revealing subtle structural information in electron micrographs, which can be important for minimising dose and for rapid imaging. In general, dynamical… read more here.
Keywords: volume imaging; topological features; imaging tracking; tracking sparse ... See more keywords