Comparative Study of Trans-linear and Trans-impedance Readout Circuits for Optical Beam Deflection Sensors in Atomic Force Microscopy
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DOI: 10.3938/jkps.74.88
Abstract: The optical beam deflection sensor remains the most popular force detection method used in atomic force microscopy. With the recent development of short cantilevers, a means for measuring small deflections at high frequencies has become… read more here.
Keywords: microscopy; trans impedance; trans linear; readout circuit ... See more keywords