Articles with "transforms measuring" as a keyword



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Continuous Wavelet Transforms for Measuring Roughness of Nanoscale Interfaces

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Published in 2018 at "Microscopy and Microanalysis"

DOI: 10.1017/s1431927618005731

Abstract: The IR determines the electron transport properties along the interface, and so interfaces can be designed for specific desired outcomes [1]. To be able to relate IR to electron transport properties a detailed description that… read more here.

Keywords: nanoscale interfaces; continuous wavelet; roughness nanoscale; measuring roughness ... See more keywords