Analysis of the transient Joule heating effect in a conductive-bridge random-access memory (CBRAM) using a single-phase-lag (SPL) model
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DOI: 10.1007/s10825-021-01681-z
Abstract: The main objective of this work is to study the transient Joule heating effect in a conductive-bridge random-access memory (CBRAM) using the single-phase-lag heat conduction model to describe the effects of the metallic conductive filament… read more here.
Keywords: transient joule; cbram; model; heating effect ... See more keywords