Fast Transistor Open-Circuit Faults Diagnosis in Grid-Tied Three-Phase VSIs Based on Average Bridge Arm Pole-to-Pole Voltages and Error-Adaptive Thresholds
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DOI: 10.1109/tpel.2017.2773130
Abstract: This paper presents a model-based method to diagnose single- and multiple-transistor open-circuit (OC) faults in grid-tied three-phase voltage-source inverters (VSIs). The method is based on calculated average bridge arm pole-to-pole (PTP) voltages and error-adaptive thresholds.… read more here.
Keywords: open circuit; transistor open; diagnosis; grid tied ... See more keywords