Experimental DC extraction of the thermal resistance of bipolar transistors taking into account the Early effect
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DOI: 10.1016/j.sse.2016.10.041
Abstract: Abstract This paper presents three methods to experimentally extract the thermal resistance of bipolar transistors taking into account the Early effect. The approaches are improved variants of recently-proposed techniques relying on common-base DC measurements. The… read more here.
Keywords: taking account; thermal resistance; account early; bipolar transistors ... See more keywords