Challenges Associated with Transmission Experiments in the SEM
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DOI: 10.1017/s1431927617003464
Abstract: STEM has been widely utilized for imaging and analysis of thin samples at much higher accelerating voltages (100 kV and up) in STEM/TEM or dedicated STEM instruments and has been studied for many years.[1] Transmission… read more here.
Keywords: experiments sem; associated transmission; transmission; challenges associated ... See more keywords