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Published in 2019 at "IEEE Electron Device Letters"
DOI: 10.1109/led.2019.2904293
Abstract: Residual stress dramatically affects the performance of piezoelectric micromachined ultrasonic transducers (pMUTs), in particular, the transmitting sensitivity. This letter presents a novel architecture for pMUTs with V-shaped springs. Stiffness modification achieved by the V-shaped springs…
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Keywords:
piezoelectric micromachined;
residual stress;
transmitting sensitivity;
micromachined ultrasonic ... See more keywords